3 Zone Thermal Shock Test Chamber For Semiconductor Testing Specific:
GB/T 2431.1-2001 Testing A: Low temperature testing method
GB/T 2431.2-2001 Testing B: High temperature testing method
GJB 150.3-1986: High temperature
GJB 150.4-1986: Low temperature
IEC68-2-1 Test A: Cold
IEC68-2-2 Test A: Dry
GB 11158 High and low temperature test term
GB/T 2423.2 << Electrolic products basic environmental test: B: high temperature method>>
Cooling system and temperature control:
1. Working way: Size selection for machine model; the cascade of mechanical refrigeration; air-cooling.
2. Refrigeration Compressors: Imported famous brand low efficiency hermetic or semi-hermetic compressors.